A UHV load lock chamber for rapid testing of novel surface-electrode ion traps

Atomic ions confined in radiofrequency rf potentials have been used as frequency standards, sensors, and platforms for quantum information processing (QIP). Surface-electrode traps are promising for scalable QIP applications because of their ease of fabrication and integration with photonics for readout and control of ions. However, testing novel trap designs is limited by the time needed to reach ultrahigh vacuum (UHV) in room temperature systems. Here, we present a chamber design that is capable of reaching UHV in ~24 hours via cryopumping on a load lock. Additionally, it features an electrically connected sample holder that allows us to swap traps with minimal reconfiguration of the electrical and optical systems. We will discuss how this chamber will enable us to rapidly test novel trap designs and explore sources of anomalous electric field noise in surface ion traps.