System Integration of the ACME III Electron Electric Dipole Moment Search
ORAL
Abstract
The third generation of ACME, ACME III, introduces several upgrades: an electrostatic lens, a longer precession region, enhanced fluorescent collection optics, and SIPM detectors, which collectively increase statistical sensitivity by an order of magnitude. Together with improved E field and B field control, we aim to sufficiently suppress known sources of systematic error. We report recent progress on the integration of these upgrades into our experiment.
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Presenters
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Zhen Han
University of Chicago
Authors
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Zhen Han
University of Chicago
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Peiran Hu
University of Chicago
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David DeMille
University of Chicago, University of Chicago and Argonne National Laboratory
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Collin Diver
Northwestern University
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John M Doyle
Harvard University
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Gerald Gabrielse
Northwestern University
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Ayami Hiramoto
Okayama University
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Nicholas R Hutzler
California Institute of Technology
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Zack Lasner
Harvard University
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Daniel G Ang
Harvard University
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Cole Meisenhelder
Harvard University
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Siyuan Liu
Northwestern University
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Takahiko Masuda
Okayama Univ
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Cristian D Panda
University of California, Berkeley, Unviersity of California, Berkeley
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Noboru Sasao
Okayama University
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Satoshi Uetake
Okayama University
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Maya Watts
Northwestern University
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Xing Wu
Harvard University, Michigan State University
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Koji Yoshimura
Okayama University, Okayama
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Xing Fan
Northwestern University