Pattern-based Functional Testing of Quantum Memories

With the growing number of qubits of quantum information processing devices, the task of fully characterizing these chips becomes increasingly unfeasible. From a practical perspective, one wants to find possible errors in the functioning of the device in as short time as possible, or otherwise establish its correct functioning with high confidence. In response to these challenges, we propose a pattern-based approach inspired by classical memory testing algorithms to evaluate the functionality of a quantum memory, based on plausible failure mechanisms. We demonstrate the method's capability to extract important qubit characteristics, such as T1 and T2 times, and to identify and analyse interactions between adjacent qubits. Additionally, our approach enables the recognition of different types of crosstalk effects and the detection of signatures indicating non-Markovian dynamics in individual qubits.