Mid-circuit partial measurement on Yb171 using the OMG architecture
POSTER
Abstract
Error correction is an important ingredient for achieving scalable and fault-tolerant quantum computing in the long term. Despite the recent experimental advances in error correction, however, mid-circuit partial measurement and reset of the physical qubit remains one of the main technical challenges on atomic platforms.
The existing approaches for achieving mid-circuit partial measurement and reset on trapped ion platforms mainly relies on the shuttling of the ions to avoid destroying the quantum information during the dissipative process, which are slow and could take up a significant portion of the runtime and causes the ion to heat up during shuttling. Here we present our recent progress on the implementation of mid-circuit measurement methods based on the optical-metastable-ground (OMG) architecture using the metastable states in Yb-171 ions.
The existing approaches for achieving mid-circuit partial measurement and reset on trapped ion platforms mainly relies on the shuttling of the ions to avoid destroying the quantum information during the dissipative process, which are slow and could take up a significant portion of the runtime and causes the ion to heat up during shuttling. Here we present our recent progress on the implementation of mid-circuit measurement methods based on the optical-metastable-ground (OMG) architecture using the metastable states in Yb-171 ions.
Presenters
-
Yichao Yu
Duke Quantum Center, Duke University
Authors
-
Yichao Yu
Duke Quantum Center, Duke University
-
Keqin Yan
Duke University
-
Debopriyo Biswas
Duke Quantum Center, Duke University, Duke University
-
Vivian Zhang
Duke Quantum Center, Duke University
-
Bahaa Harraz
Duke Quantum Center, Duke University
-
Marko Cetina
Duke University
-
Crystal Noel
Duke University
-
Alexander Kozhanov
Duke University, Duke Quantum Center, Duke University
-
Christopher Monroe
Duke University