Optical Birefringence and Electric fields control for the ACME III Electron Electric Dipole Moment Search
POSTER
Abstract
In ACME III, a pair of ITO-coated transparent electric field plates are used to apply the E field for the experiment. The birefringence of the field plates can cause elliptic imperfections in the laser beams passing through for quantum state manipulation, which is known to cause systematic errors. Stress-free mounting schemes with precise adjustability ensuring birefringence-free for the field plates (induced ellipticity on linearly polarized light, or S/I, <0.01%/mm) have been developed and demonstrated. Electric field imperfections are another potential source for systematic errors; shimming plates designs are developed to minimize edge effect from finite dimensions and non-reversing effect of E field from dielectric materials. Parallelism of the plates is ensured with white light interferometry after installation.
We will also go through some other technical upgrades of the experiment, including laser system with PDH locking to ultra-low expansion (ULE) cavities and phase-locking to GPS-steered comb for improved robustness and stability.
Presenters
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Peiran Hu
University of Chicago
Authors
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Peiran Hu
University of Chicago
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David DeMille
University of Chicago, University of Chicago and Argonne National Laboratory
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Collin Diver
Northwestern University
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John M Doyle
Harvard University
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Gerald Gabrielse
Northwestern University
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Ayami Hiramoto
Okayama University
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Nicholas R Hutzler
California Institute of Technology
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Zack Lasner
Harvard University
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Siyuan Liu
Northwestern University
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Takahiko Masuda
Okayama Univ
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Cristian D Panda
UC Berkeley
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Noboru Sasao
Okayama University
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Satoshi Uetake
Okayama University
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Maya Watts
Northwestern University
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Daniel G Ang
Harvard University
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Xing Wu
Harvard University, Michigan State University
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Cole Meisenhelder
Harvard University
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Koji Yoshimura
Okayama University, Okayama
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Zhen Han
University of Chicago
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Xing Fan
Northwestern University