high-resolution x-ray stimulated Raman spectroscopy using stochastic pulses
POSTER
Abstract
The X-ray free-electron lasers (XFELs) generate high-intensity x-ray pulses, which enable x-ray nonlinear spectroscopies. The extension of nonlinear spectroscopies to the x-ray domain promises the observation of electronic dynamics in their natural timescale with atomic spatial resolution. Stimulated x-ray Raman spectroscopy is an especially powerful tool, which works in a propagation mode and combines large signal enhancement through stimulated emission with ultrahigh energy resolution that overcomes the core-hole lifetime broadening. We present high-resolution stimulated Raman spectroscopy realized using stochastic XFEL pulses and correlation techniques. A covariance map between the transmitted incident SASE pulse and the stimulated Raman scattering produces a high-resolution x-ray Raman spectrum. This promising tool could be applied to study ultrafast electronic and molecular dynamics such as charge transfer in complex systems.
Presenters
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kai li
University of Chicago
Authors
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kai li
University of Chicago
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Linda Young
Argonne Nat'l Lab, Argonne National Laboratory
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Alexander Magunia
Heidelberg University
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Christian Ott
Max-Planck-Institut für Kernphysik
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Gilles Doumy
Argonne National Laboratory
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Thomas Pfeifer
Max-Planck-Inst Kernphys, Max-Planck-Institut für Kernphysik, Max Planck Inst Kernphys
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Rubensson Jan-Erik
uppsala university
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Michael Meyer
EuXFEL, European XFEL
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Tommaso Mazza
EuXFEL, European XFEL
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Marc Rebholz
uppsala university