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high-resolution x-ray stimulated Raman spectroscopy using stochastic pulses

POSTER

Abstract

The X-ray free-electron lasers (XFELs) generate high-intensity x-ray pulses, which enable x-ray nonlinear spectroscopies. The extension of nonlinear spectroscopies to the x-ray domain promises the observation of electronic dynamics in their natural timescale with atomic spatial resolution. Stimulated x-ray Raman spectroscopy is an especially powerful tool, which works in a propagation mode and combines large signal enhancement through stimulated emission with ultrahigh energy resolution that overcomes the core-hole lifetime broadening. We present high-resolution stimulated Raman spectroscopy realized using stochastic XFEL pulses and correlation techniques. A covariance map between the transmitted incident SASE pulse and the stimulated Raman scattering produces a high-resolution x-ray Raman spectrum. This promising tool could be applied to study ultrafast electronic and molecular dynamics such as charge transfer in complex systems.

Presenters

  • kai li

    University of Chicago

Authors

  • kai li

    University of Chicago

  • Linda Young

    Argonne Nat'l Lab, Argonne National Laboratory

  • Alexander Magunia

    Heidelberg University

  • Christian Ott

    Max-Planck-Institut für Kernphysik

  • Gilles Doumy

    Argonne National Laboratory

  • Thomas Pfeifer

    Max-Planck-Inst Kernphys, Max-Planck-Institut für Kernphysik, Max Planck Inst Kernphys

  • Rubensson Jan-Erik

    uppsala university

  • Michael Meyer

    EuXFEL, European XFEL

  • Tommaso Mazza

    EuXFEL, European XFEL

  • Marc Rebholz

    uppsala university