Randomized Benchmarking Using Non-Destructive Readout

Holographically generated arrays of Rydberg atoms have emerged as a competitive, highly scalable platform for quantum computing and simulation. While gate operation fidelities have improved significantly in recent years, state detection methods require further attention. Current experiments typically read out the state of the qubits by inducing state-selective atom loss and are therefore unable to distinguish different loss mechanisms. Furthermore, this destructive detection method is incompatible with repetitive error correction algorithms and necessitates re-loading of atoms on every experimental cycle.

We present the first practical application of a non-destructive readout (NDRO) procedure in the context of randomized benchmarking of microwave single qubit gates. Results on an array of 225 stochastically-loaded Cs atoms using conventional readout demonstrate that our system is capable of performing below the 1x10^-4 error threshold for fault tolerance. By increasing trap depth and reducing array size to 49, we perform NDRO by scattering light on a cycling transition for 10 ms to achieve a 99% detection fidelity and a 90% survival probability. This allows us to use post-selection methods and reduce our state preparation and measurement error.