Sensitivity Measurements of UHF-Band Electric Fields with Electromagnetically-Induced Transparency and Heterodyne Detection
POSTER
Abstract
Publication: https://arxiv.org/abs/2205.12876
Presenters
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Michael A Viray
Georgia Tech Research Institute
Authors
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Michael A Viray
Georgia Tech Research Institute
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Baran N Kayim
Georgia Tech Research Institute
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Jasmine Jones
Georgia Tech Research Institute
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Robert Wyllie
Georgia Tech Research Institute
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Brian C Sawyer
Georgia Tech Research Institute
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Samuel Berweger
National Institute of Standards and Technology, Boulder, National Institute of Standards and Tech, National Institute of Standards and Technology
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Nikunjkumar Prajapati
National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology
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Alexandra B Artusio-Glimpse
National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology
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Andrew P Rotunno
National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology
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Roger C Brown
NIST, National Institute of Standards and Technology
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Christopher L Holloway
National Institute of Standards and Technology
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Matthew T Simons
National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology Boulder, National Institute of Standards and Technology
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Eric Imhof
Northrop Grumman
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Steven R Jefferts
Northrop Grumman
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Jonathan M Wheeler
Northrop Grumman
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Thad G Walker
University of Wisconsin-Madison