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Sensitivity Measurements of UHF-Band Electric Fields with Electromagnetically-Induced Transparency and Heterodyne Detection

POSTER

Abstract

We present results on Rydberg atom-based electric field sensing in the ultra high frequency (UHF) radio band. Like other frequency bands of radio and microwave radiation, UHF signals can be detected with atom-based field sensing by resonantly driving Rydberg-Rydberg transitions and observing the atomic response. In this work, we utilize a three-photon excitation scheme to excite rubidium-87 atoms in a vapor cell to Rydberg F-states. At these states, UHF signals can resonantly drive nF → nG transitions and perturb the absorption coefficient of the atomic vapor. The magnitude of the UHF signals is then determined by monitoring the absorption of the probe laser through the vapor cell. We measure applied signal fields with heterodyne detection, which allows for enhanced detection of weak fields. The sensor's resonant frequency and sensitivity are a function of the principal quantum number n of the nF → nG transition; for n = 45, we report a sensitivity of 3.9 μV/(m√Hz) at a signal frequency of 899 MHz.

Publication: https://arxiv.org/abs/2205.12876

Presenters

  • Michael A Viray

    Georgia Tech Research Institute

Authors

  • Michael A Viray

    Georgia Tech Research Institute

  • Baran N Kayim

    Georgia Tech Research Institute

  • Jasmine Jones

    Georgia Tech Research Institute

  • Robert Wyllie

    Georgia Tech Research Institute

  • Brian C Sawyer

    Georgia Tech Research Institute

  • Samuel Berweger

    National Institute of Standards and Technology, Boulder, National Institute of Standards and Tech, National Institute of Standards and Technology

  • Nikunjkumar Prajapati

    National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology

  • Alexandra B Artusio-Glimpse

    National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology

  • Andrew P Rotunno

    National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology

  • Roger C Brown

    NIST, National Institute of Standards and Technology

  • Christopher L Holloway

    National Institute of Standards and Technology

  • Matthew T Simons

    National Institute of Standards and Technology, Boulder, National Institute of Standards and Technology Boulder, National Institute of Standards and Technology

  • Eric Imhof

    Northrop Grumman

  • Steven R Jefferts

    Northrop Grumman

  • Jonathan M Wheeler

    Northrop Grumman

  • Thad G Walker

    University of Wisconsin-Madison