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A next-generation trapped ion quantum computing system

ORAL

Abstract

The first generation of a universal trapped ion integrated quantum processor, constructed in a collaboration between our group and industrial partners, was used to perform quantum algorithms with high-fidelity on 13 qubits, and high-fidelity quantum gates with up to 23 qubits.

In this work we discuss the progress of commissioning the second-generation trapped-ion universal quantum computer. We present the initial characterization of the system, including the heating rates, coherence times, background collision rate, cross talk and other factors contributing to the gate fidelity. These results showcase the design improvements in the system, such as a new generation micro-fabricated surface ion trap from Sandia National Laboratories, an upgraded Raman optical addressing system built in collaboration with L3Harris, and an improved vacuum system.

Presenters

  • Yichao Yu

    DQC/Duke ECE

Authors

  • Yichao Yu

    DQC/Duke ECE

  • Liudmila Zhukas

    DQC/Duke ECE

  • Lei Feng

    Duke Quantum Center and Department Electrical and Computer Engineering (and Physics), Duke University, Durham, NC, JQI/QuICS/UMD Physics, DQC/Duke ECE

  • Marko Cetina

    Duke Quantum Center and Department of Physics, Duke University, Durham, NC, JQI/QuICS/UMD Physics, DQC/Duke ECE, Duke University

  • Crystal Noel

    JQI/QuICS/UMD Physics, DQC/Duke ECE

  • Debopriyo Biswas

    JQI/QuICS/UMD Physics, DQC/Duke ECE

  • Andrew Risinger

    University of Maryland, College Park, JQI/QuICS/UMD Physics

  • Vivian Zhang

    DQC/Duke ECE

  • Keqin Yan

    DQC/Duke ECE

  • Bahaa Harraz

    DQC/Duke ECE

  • Grant Eberle

    DQC/Duke ECE

  • Alexander Kozhanov

    DQC/Duke ECE

  • Christopher Monroe

    Duke Quantum Center and Departments of Electrical and Computer Engineering and Physics, Duke University; IonQ, Inc., JQI/QuICS/UMD Physics, DQC/Duke ECE, IonQ