Combined ion trap and surface-science system for investigating electric-field noise from surfaces

Electric-field noise from surfaces can pose problems in experiments in the quantum regime.  In quantum information processing with trapped ions, this noise causes heating of the ions’ motion, which complicates large-scale quantum computing by limiting the fidelity of multi-qubit operations.  Noise levels far above intrinsic Johnson noise have been observed for the past few decades, yet a complete description of the mechanisms responsible for this noise remains to be developed.  There is strong evidence that it originates from processes on electrode surfaces.  We report on progress towards investigating electric field noise from surfaces using a “stylus” ion trap integrated with a surface-science cluster of instruments.  The combined system allows for in situ treatment and characterization of surfaces and UHV transfer into the proximity of a trapped ion.  Ion heating-rate measurements are performed to quantify the distance- and frequency-dependence of noise originating from a sample surface.  This combined setup may allow for high-throughput correlation of heating with surface features such as morphology and adsorbate coverage.  This may aid a more complete understanding of electric-field noise from surfaces where highly specific data can inform theoretical models.