Observation and Identification of Extreme Ultraviolet Spectra from Ca-like Nd XLI to Na-like Nd L
ORAL
Abstract
Extreme-ultraviolet spectra of M-shell transitions in highly charged Ca-like Nd40+ to Na-like Nd49+ has been measured at the electron beam ion trap (EBIT) facility at the National Institute of Standards and Technology [1]. To create the corresponding charge states, the electron beam energy was varied between 3.60 keV and 12.02 keV. The spectra were observed between 2.67 nm and 17.30 nm using a flat-field grazing incidence spectrometer [2]. The spectra calibrations were based on well-known lines from neon, xenon, iron, oxygen, and argon produced in the EBIT. Simulated spectra generated with a detailed collisional-radiative (CR) model [3] of the non-Maxwellian EBIT plasma were used to classify the observed lines. Forty-seven spectral lines were identified for the first time. The total uncertainties included contributions from estimated systematic uncertainties, statistical uncertainties from fitting, and calibration uncertainties. The measured Nd spectra and the tabulated spectral lines with the associated line identifications will be presented and discussed.
1. J. D. Gillaspy, Phys. Scr. T71, 99 (1997). 2. B. Blagojevic et al., Rev. Sci. Instrum.76, 083102 (2005). 3. Yu. Ralchenko and Y. Maron, J. Quant. Spectr. Rad. Transfer 71, 609 (2001).
1. J. D. Gillaspy, Phys. Scr. T71, 99 (1997). 2. B. Blagojevic et al., Rev. Sci. Instrum.76, 083102 (2005). 3. Yu. Ralchenko and Y. Maron, J. Quant. Spectr. Rad. Transfer 71, 609 (2001).
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Presenters
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Yang Yang
Clemson University
Authors
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Yang Yang
Clemson University
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Dipti Fnu
National institute of Standards and Technology, Gaithersburg, MD 20899, USA
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Chihiro Suzuki
National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5259, Japan
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Amy Gall
Smithsonian Astrophysical Observatory
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Roshani Silwal
Appalachian State University
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Samuel Sanders
Clemson University
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Joseph Tan
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA, National Institute of Standards and Technology
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Aung S Naing
University of Delaware, University of Delaware, National Institute of Standards and Technology
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Yuri Ralchenko
National Institute of Standards and Technology
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Endre Takacs
Clemson University