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An Apparatus for Generation and Isolation of Highly Charged Ions with Low Ionization Thresholds

POSTER

Abstract

Electron beam ion traps (EBITs) have provided access to a wide range of highly charged ions for various applications. The recent use of high-field permanent magnets—e.g., neodymium iron boron (NdFeB)—has made it possible to construct small EBITs and other traps like Penning traps. Potential applications include creating certain low ionization threshold highly charged ions, such as Pr9+ and Nd10+, proposed as interesting candidates for the development of next-generation atomic clocks, quantum information processing, or the search for variation in the fine-structure constant [1]. At NIST, a miniaturized electron beam ion trap (mini-EBIT) using a pair of NdFeB magnets has been built as a source of ions with relatively low ionization thresholds (< 1000 eV) [2]. To recapture ions of interest produced in the mini-EBIT, we discuss the design and assembly of a NdFeB permanent magnet Penning trap with a peak magnetic field of ≈ 0.77 T along with the ion transport beamline. The apparatus (both mini-EBIT and Penning trap) is designed to be portable to facilitate its use in various experiments.

Publication: [1] M. Safronova, et al., PRL 113, 030801 (2014).<br>[2] A Miniaturized Dual-Anode Electron Beam Ion Trap Using Rare-Earth Magnets, A. S. Naing, E. B. Norrgard, B. C. Foo, and J. N. Tan, (in preparation)<br>

Presenters

  • Aung S Naing

    University of Delaware, National Institute of Standards and Technology, University of Delaware, National Institute of Standards & Technology, University of Delaware, National Institute of Standards and Technology, Gaithersburg, MD, National Institute of Standards and Technology, Gaithersburg, MD 20899

Authors

  • Aung S Naing

    University of Delaware, National Institute of Standards and Technology, University of Delaware, National Institute of Standards & Technology, University of Delaware, National Institute of Standards and Technology, Gaithersburg, MD, National Institute of Standards and Technology, Gaithersburg, MD 20899

  • David La Mantia

    Clemson University, National Institute of Standards and Technology, Clemson University, National Institute of Standards & Technology

  • Joseph Tan

    National Institute of Standards and Technology, National Institute of Standards & Technology, National Institute of Standards and Technology, Gaithersburg, MD, National Institute of Standards and Technology, Gaithersburg, MD 20899