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Spectroscopy of highly charged Rydberg ions made by dielectronic recombination in few-electron Ar

POSTER

Abstract

Rydberg Highly Charged Ions (RyHCI) are interesting systems to study as they provide excellent test beds for precision tests of quantum electrodynamics and precision X-ray wavelength standards. Moreover, certain high angular momentum states are considered to be potentially useful for measuring fundamental constants. Dielectronic Recombination (DR) is a significant process that results in the production of Rydberg states. We present X-ray spectra as a function of the electron beam energy that show the signatures of different processes populating electronic levels including DR. Measurements were done at the Electron Beam Ion Trap (EBIT) facility at the National Institute of Standards and Technology using an X-ray transition-edge sensor micro calorimeter. The Flexible Atomic Code (FAC) was used to identify the X-ray features related to the atomic processes involved.

Presenters

  • Timothy J Burke

    Clemson University

Authors

  • Timothy J Burke

    Clemson University

  • Amy Gall

    Harvard-Smithsonian Center for Astrophysics

  • Yang Yang

    Clemson University

  • Galen O'Neil

    National Institute of Standards, National Institute of Standards and Technology, National Institute of Standards and Technology, Boulder, CO 80305

  • Paul Szypryt

    National Institute of Standards and Technology, National Institute of Standards and Technology, Boulder, CO, National Institute of Standards and Technology, Boulder, CO 80305

  • Dipti Dipti

    National Institute of Standards and Technology, National Institute of Standards and Technology, Gaithersburg, MD, National Institute of Standards and Technology, Gaithersburg, MD 20899, NIST

  • Joseph N Tan

    National Institute of Standards and Technology

  • Aung S Naing

    University of Delaware, National Institute of Standards and Technology, University of Delaware, National Institute of Standards & Technology, University of Delaware, National Institute of Standards and Technology, Gaithersburg, MD, National Institute of Standards and Technology, Gaithersburg, MD 20899

  • Yuri Ralchenko

    National Institute of Standards and Technology

  • Endre Takacs

    Clemson University

  • Joan Marler

    Clemson University