Detector Efficiencies of the Dielectron Decay of the Upsilon Meson from a Single Electron Simulation

In the analysis of heavy flavor meson production in high energy hadron collisions, it is important to have an accurate estimation of efficiencies in order to determine total yield. To calculate these efficiencies at the STAR detector, we use a method called embedding in which simulated particles are embedded into real event data. Because the embedding process is computationally intensive and requires a significant amount of time, we have developed a method to simulate the embedding of the dielectron Upsilon decay using only single electron embedding data. This enables us to extract the relevant information without having to generate a new data set, thus saving computation time. We present the motivation, method, and results of extracting Upsilon efficiencies from single electron embedding at STAR.