Irradiation testing of ASICs for the HL-LHC ATLAS ITk Strip Detector

For the high-luminosity upgrade to the Large Hadron Collider (HL-LHC), the ATLAS Inner Detector will be replaced by an all-silicon tracker called the Inner Tracker (ITk), which consists of two systems: pixels and strips. The work presented will focus on two of the ITk Strip ASICs: the Hybrid Control Chip (HCC) and the Autonomous Monitoring and Control Chip (AMAC). Together, HCC and AMAC are responsible for performing system readout, monitoring, and control. To ensure these ASICs will successfully operate in the high-radiation environment of the HL-LHC, they need to be tested for radiation tolerance. Single event effects (SEEs) occur when high energy particles ionize materials as they pass through. The ASIC designs have SEE protection in place, and these protections can be tested by placing the ASICs in testbeams at laboratory facilities and monitoring their performance. Tests have been performed using both heavy ions and protons, and the ASIC designs were shown to protect against SEEs due to radiation. This talk will include background on SEEs, details of each test campaign, and results with interpretation in terms of HL-LHC performance.