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Progress on Precision Cross Section Measurements with the NIST Alpha-Gamma Device

ORAL

Abstract

The Alpha-Gamma device at the National Institute of Standards and Technology utilizes the interaction of neutrons with a totally absorbing $^{10}$B target to precisely measure the flux of a monochromatic neutron beam. This measurement provides a calibration of the $^{6}$Li(n,$alpha$)$^{3}$H based flux monitor used in the NIST neutron lifetime experiment to better than 0.1,\% and is also being utilized in novel, 0.2,\% level, measurements of the $^{235}$U neutron-induced fission and $^6$Li neutron capture cross sections in an effort to provide systematically independent determinations of these important quantities. Each of these measurements requires ancillary efforts to characterize, for example, device solid angles, target characteristics, and alpha counting efficiencies. The results of recent and ongoing characterization measurements will be presented.

Presenters

  • Hans P Mumm

    National Institute of Standards and Tech

Authors

  • Hans P Mumm

    National Institute of Standards and Tech

  • Evan R Adamek

    University of Hawaii

  • Jimmy Caylor

    Syracuse University

  • Maynard Dewey

    National Institute of Standards and Technology

  • Richard Essex

    National Institute of Standards and Technology

  • Elisa Pirovano

    Physikalisch-Technische Bundesanstalt

  • Elizabeth M Scott

    Centre College

  • Mark Tyra

    National Institute of Standards and Technology