Optical constants of bulk SrTiO3, Al2O3 on SrTiO3, and BaSnO3 on SrTiO3 using ellipsometry
POSTER
Abstract
We measured the ellipsometric angles Ψ and △ for bulk SrTiO3 (STO) before and after cleaning (isopropanol and ozone cleaning at 150°C for 20 minutes) on a Variable Angle Spectroscopic Ellipsometer (VASE) from 0.5 to 6.6 eV with 0.01 eV steps at four different angles of incidence from 60° to 75° with a step size of 5°. We found that ozone cleaning is a better cleaning method than isopropanol. Due to the surface roughness and remaining surface layers, the imaginary part of the pseudodielectric function below the band gap of STO (3.2 eV) is positive and is used to calculate the thickness of the surface layers on STO as 19.7 Å. Using these results, we developed a VASE model for bulk STO to describe the optical constants of STO.
Al2O3/STO and BaSnO3/STO samples were ozone cleaned and then we measured the ellipsometric angles under the same conditions. The clean removes most of the water and chemical molecules attached to the Al2O3 and BaSnO3 (BSO) surface. We used this STO model to find the surface layer thickness and optical constants of Al2O3/STO using the Al2O3 layer thickness of 49 Å from XRR and of BSO/STO using the BSO layer thickness of 136 Å from XRR. We also compared the optical constants of bulk STO with STO on Al2O3/STO and BSO/STO.
Al2O3/STO and BaSnO3/STO samples were ozone cleaned and then we measured the ellipsometric angles under the same conditions. The clean removes most of the water and chemical molecules attached to the Al2O3 and BaSnO3 (BSO) surface. We used this STO model to find the surface layer thickness and optical constants of Al2O3/STO using the Al2O3 layer thickness of 49 Å from XRR and of BSO/STO using the BSO layer thickness of 136 Å from XRR. We also compared the optical constants of bulk STO with STO on Al2O3/STO and BSO/STO.
Presenters
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Yoshitha Hettige
New Mexico State University
Authors
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Yoshitha Hettige
New Mexico State University
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Stefan Zollner
New Mexico State University
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Suyeong Jang
University of Texas at Austin
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Alexander A Demkov
University of Texas at Austin
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Wente Li
University of Texas at Austin