Volumetric nanoscale strain visualization using Bragg x-ray coherent diffraction imaging

Nanoscopic strain engineering is an innovative pathway which holds great potential in functional device application [memory, photactive materials, sensors, diodes, etc.]. Therefore: volumetric imaging of strain at the nanoscale is important for understanding and designing these devices. In my presentation I will overview Bragg X-ray Coherent Diffractive Imaging (BCDI) of topological defects in ferroelectrics and ferroelectric devices in operando. Through this, the audience will be introduced to how BCDI can act as a liaison between theory, design, and application of the next generation of electronic devices.