Scanning Field Emission Microscopy

POSTER

Abstract

We describe a ``new'' scanning probe method that is useful for imaging rough or insulating surfaces in vacuum. A conventional STM is operated in feedback mode with high bias voltage (up to 100V) and field-emission current (few nA). The large tip-sample distance (up to 50nm) makes imaging more robust than for tunneling, while retaining good lateral and vertical resolution (a few nm). This is demonstrated with images of atomic steps on Si(111) under a native oxide film. A simple electrostatic model for the imaging is presented.

Authors

  • Samuel Tobler

    Arizona State University Physics Dept

  • Andrew Polemi

    Utah State University, Brigham Young University, University of Pennsylvania, Lawrence Livermore National Laboratory, Los Alamos National Laboratory, High Altitude Observatory, University of Colorado at Boulder, Massachutes Institute of Technology, Utah Valley University, University of New Hampshire, Applied Physics Laboratory, Johns Hopkins University, University of Montana, Southwest Research Institute, University of Southern California, Lockheed Martin Advanced Technology Center, University of Chicago, Massachusetts Institute of Technology, SciPrint.org, Centre National de la Recherche Scientifique, Colorado State University, V. Alecsandri College, Bacau, Romania, Colorado School of Mines, National Renewable Energy Laboratory, Utah State University, Department of Physics, Brigham Young University, Provo, Huntsman Cancer Institute, Brigham Young University - Idaho, University of Arizona, Florida State University, Weber State University, Brigham Young University - Provo, New Mexico State University, Colorado State University, Fort Collins, CO 80523