Noise characterization of an injection-locked ti:sapphire laser

We use a microwave interferometer and an offset frequency lock to characterize the noise properties of an injection-locked ti:sapphire laser. We find a laser linewidth of 2 MHz and an rms amplitude noise of a few percent. In this presentation I will describe the laser, the interferometer, the offset lock, and the measurement results. Our results will be compared with a recently published model.